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Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel. Wrapper design for embedded core test. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 911-920, IEEE Computer Society, 2000.

This author has not been identified. Look up 'Yervant Zorian' in GoogleThis author has not been identified. Look up 'Erik Jan Marinissen' in GoogleThis author has not been identified. Look up 'Maurice Lousberg' in GoogleThis author has not been identified. Look up 'Sandeep Kumar Goel' in Google

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