Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, Sandeep Kumar Goel. Wrapper design for embedded core test. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 911-920, IEEE Computer Society, 2000.
@inproceedings{ZorianMLG00,
title = {Wrapper design for embedded core test},
author = {Yervant Zorian and Erik Jan Marinissen and Maurice Lousberg and Sandeep Kumar Goel},
year = {2000},
tags = {testing, design},
researchr = {https://researchr.org/publication/ZorianMLG00},
cites = {0},
citedby = {0},
pages = {911-920},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}