Interconnect Open Defect Diagnosis with Physical Information

Wei Zou, Wu-Tung Cheng, Sudhakar M. Reddy. Interconnect Open Defect Diagnosis with Physical Information. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 203-209, IEEE, 2006. [doi]

Abstract

Abstract is missing.