Wei Zou, Chris C. N. Chu, Sudhakar M. Reddy, Irith Pomeranz. Optimizing SOC Test Resources Using Dual Sequences. In Manfred Glesner, Ricardo Augusto da Luz Reis, Leandro Soares Indrusiak, Vincent John Mooney III, Hans Eveking, editors, VLSI-SOC: From Systems to Chips - IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003), December 1-3, 2003, Darmstadt, Germany. Volume 200 of IFIP, pages 181-196, Springer, 2003. [doi]
@inproceedings{ZouCRP03a,
title = {Optimizing SOC Test Resources Using Dual Sequences},
author = {Wei Zou and Chris C. N. Chu and Sudhakar M. Reddy and Irith Pomeranz},
year = {2003},
doi = {10.1007/0-387-33403-3_12},
url = {http://dx.doi.org/10.1007/0-387-33403-3_12},
researchr = {https://researchr.org/publication/ZouCRP03a},
cites = {0},
citedby = {0},
pages = {181-196},
booktitle = {VLSI-SOC: From Systems to Chips - IFIP TC 10/ WG 10.5 Twelfth International Conference on Very Large Scale Integration of System on Chip (VLSI-SoC 2003), December 1-3, 2003, Darmstadt, Germany},
editor = {Manfred Glesner and Ricardo Augusto da Luz Reis and Leandro Soares Indrusiak and Vincent John Mooney III and Hans Eveking},
volume = {200},
series = {IFIP},
publisher = {Springer},
isbn = {978-0-387-33402-8},
}