SOC Test Scheduling Using Simulated Annealing

Wei Zou, Sudhakar M. Reddy, Irith Pomeranz, Yu Huang. SOC Test Scheduling Using Simulated Annealing. In 21st IEEE VLSI Test Symposium (VTS 2003), 27 April - 1 May 2003, Napa Valley, CA, USA. pages 325-330, IEEE Computer Society, 2003. [doi]

Authors

Wei Zou

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Sudhakar M. Reddy

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Irith Pomeranz

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Yu Huang

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