A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer

X. Zou, J. P. Xu, C. X. Li, P. T. Lai, W. B. Chen. A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer. Microelectronics Reliability, 47(2-3):391-394, 2007. [doi]

Authors

X. Zou

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J. P. Xu

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C. X. Li

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P. T. Lai

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W. B. Chen

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