X. Zou, J. P. Xu, C. X. Li, P. T. Lai, W. B. Chen. A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer. Microelectronics Reliability, 47(2-3):391-394, 2007. [doi]
@article{ZouXLLC07,
title = {A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer},
author = {X. Zou and J. P. Xu and C. X. Li and P. T. Lai and W. B. Chen},
year = {2007},
doi = {10.1016/j.microrel.2006.05.019},
url = {http://dx.doi.org/10.1016/j.microrel.2006.05.019},
tags = {C++},
researchr = {https://researchr.org/publication/ZouXLLC07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {2-3},
pages = {391-394},
}