TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection - researchr publication authors

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Laura Zunarelli, Luigi Balestra, Susanna Reggiani, Raj Sankaralingam, Mariano Dissegna, Gianluca Boselli. TCAD study of the Holding-Voltage Modulation in Irradiated SCR-LDMOS for HV ESD Protection. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-6, IEEE, 2023. [doi]

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