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Dong-Hoon Han. Built-In Self Test and Calibration of RF Systems for Parametric Failures. PhD thesis, Georgia Institute of Technology, Atlanta, GA, USA, 2007. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST)Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt. iolts 2005: 106-111 [doi]
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