Selim Sermet Akbay - researchr alias

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Viewing Publication 1 - 7 from 7

2007

Testing RF Components with Supply Current SignaturesSelim Sermet Akbay, Shreyas Sen, Abhijit Chatterjee. ats 2007: 393-398 [doi]

Fault-based alternate test of RF componentsSelim Sermet Akbay, Abhijit Chatterjee. iccd 2007: 518-525 [doi]

Signature Testing of Analog and RF Circuits: Algorithms and MethodologyRamakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee. tcas, 54-I(5):1018-1031, 2007. [doi]

2006

Alternate Test of RF Front Ends with IP Constraints: Frequency Domain Test Generation and ValidationSelim Sermet Akbay, Jose L. Torres, Julie M. Rumer, Abhijit Chatterjee, Joel Amtsfield. itc 2006: 1-10 [doi]

2005

Built-In Test of RF Components Using Mapped Feature Extraction SensorsSelim Sermet Akbay, Abhijit Chatterjee. vts 2005: 243-248 [doi]

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST)Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt. iolts 2005: 106-111 [doi]

2004

Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise ReferenceSelim Sermet Akbay, Abhijit Chatterjee. vts 2004: 273-290 [doi]

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