Adrian Evans, Stefano Di Carlo, Praveen Raghavan, Dimitris Gizopoulos, editors, Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016. Volume 1566 of CEUR Workshop Proceedings, CEUR-WS.org, 2016. [doi]
Conference: date2016
@proceedings{date-2016ermavss, title = {Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016}, year = {2016}, url = {http://ceur-ws.org/Vol-1566}, researchr = {https://researchr.org/publication/date-2016ermavss}, cites = {0}, citedby = {0}, booktitle = {Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, ERMAVSS 2016, co-located with IEEE/ACM Design, Automation and Test in Europe Conference (DATE 2016), Dresden, Germany, March 18, 2016}, conference = {date}, editor = {Adrian Evans and Stefano Di Carlo and Praveen Raghavan and Dimitris Gizopoulos}, volume = {1566}, series = {CEUR Workshop Proceedings}, publisher = {CEUR-WS.org}, }