Abstract is missing.
- Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault ModelJean-Max Dutertre, Vincent Beroulle, Philippe Candelier, Stephan De Castro, Louis-Barthelemy Faber, Marie-Lise Flottes, Philippe Gendrier, David Hély, Régis Leveugle, Paolo Maistri, Giorgio Di Natale, Athanasios Papadimitriou, Bruno Rouzeyre. 1-6 [doi]
- Locked out by Latch-up? An Empirical Study on Laser Fault Injection into Arm Cortex-M ProcessorsBodo Selmke, Kilian Zinnecker, Philipp Koppermann, Katja Miller, Johann Heyszl, Georg Sigl. 7-14 [doi]
- Breaking Redundancy-Based Countermeasures with Random Faults and Power Side ChannelSayandeep Saha, Dirmanto Jap, Jakub Breier, Shivam Bhasin, Debdeep Mukhopadhyay, Pallab Dasgupta. 15-22 [doi]
- Darth's Saber: A Key Exfiltration Attack for Symmetric Ciphers Using Laser LightVittorio Zaccaria, Maria Chiara Molteni, Filippo Melzani, Guido Bertoni. 23-26 [doi]
- Glitch-Resistant Masking Schemes as Countermeasure Against Fault Sensitivity AnalysisVictor Arribas, Thomas De Cnudde, Danilo Sijacic. 27-34 [doi]
- Genetic Algorithm-Based Electromagnetic Fault InjectionAntun Maldini, Niels Samwel, Stjepan Picek, Lejla Batina. 35-42 [doi]
- The Impact of Pulsed Electromagnetic Fault Injection on True Random Number GeneratorsMaxime Madau, Michel Agoyan, Josep Balasch, Milos Grujic, Patrick Haddad, Philippe Maurine, Vladimir Rozic, Dave Singelée, Bohan Yang 0001, Ingrid Verbauwhede. 43-48 [doi]
- Random Numbers Generation: Tests and AttacksSylvain Guilley, Youssef El Housni. 49-54 [doi]