Hassan Farhat - researchr alias

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Viewing Publication 1 - 18 from 18

2009

An Efficient Algorithm for Determining Polygon Points OrderingHassan Farhat. fecs 2009: 278-281

Transformations and Basis in the Computer Graphics Viewing PipelineHassan Farhat. fecs 2009: 267-271

2008

An Interactive Computer Design in MultisimHassan Farhat. cata 2008: 281-286

Integrating electronics in computer science under curricula constraints, a comparative studyHassan Farhat. eit 2008: 140-144 [doi]

A Simple Computer Design with Monitor Interface: Integrating Hardware and Software in Early Research in Computer ScienceHassan Farhat. icsnc 2008: 218-222 [doi]

2005

Graph Partitioning for Circuit TestabilityHassan Farhat. caine 2005: 280-284

Integrating Hardware and Software in Early Research in Computer ScienceHassan Farhat. caine 2005: 390-394

2001

A Mathematical Foundation Course for Undergraduate Degree in Information TechnologyHassan Farhat. ISCAicis 2001: 140-143

Combining the Hardware Track in a Single Migration CourseHassan Farhat. ISCAicis 2001: 134-139

Test Generation for VLSI Circuits from Testability Profile DistributionHassan Farhat. caine 2001: 201-204

A Polygon Scan Algorithm Independent of the Use of an Active Edge ListHassan Farhat. caine 2001: 283-286

1994

A Quadratic Programming Approach to Estimating the Testability and Random or Deterministic Coverage of a VLSl CircuitHassan Farhat, Steven G. From. vlsi, 2(3):223-231, 1994. [doi]

1992

Estimating testability and coverage distributions of a VLSI circuit from a mixture of discrete and continuous functionsHassan Farhat, Mansour Zand, Hossein Saiedian. SAC 1992: 433-437 [doi]

Bounds on population coverage using test generation by fault samplingHassan Farhat, Steven G. From. mam, 16(5):269-275, 1992. [doi]

Persistent structures to store moving imagesMansour Kazerooni-Zand, Hassan Farhat, Hossein Saiedian. SAC 1992: 21-27 [doi]

1991

A team-oriented, project-intensive database courseHossein Saiedian, Hassan Farhat. sigcse 1991: 192-198 [doi]

1990

A Statistical Theory of Digital Circuit TestabilitySharad C. Seth, Vishwani D. Agrawal, Hassan Farhat. TC, 39(4):582-586, 1990.

1988

Test generation by fault samplingVishwani D. Agrawal, Hassan Farhat, Sharad Seth. iccd 1988: 58-61 [doi]

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