Valentin Gherman, Samuel Evain, Fabrice Auzanneau, Yannick Bonhomme. Programmable extended SEC-DED codes for memory errors. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 140-145, IEEE Computer Society, 2011. [doi]
Abstract is missing.