Georges G. E. Gielen, Elie Maricau, Peter H. N. De Wit. Analog circuit reliability in sub-32 nanometer CMOS: Analysis and mitigation. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1474-1479, IEEE, 2011. [doi]
Abstract is missing.