3D Stacked IC layout considering bond pad density and doubling for manufacturing yield improvement

Ding-Ming Kwai, Chang-Tzu Lin. 3D Stacked IC layout considering bond pad density and doubling for manufacturing yield improvement. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 129-134, IEEE, 2011. [doi]

Abstract

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