QC-Fill: An X-Fill method for quick-and-cool scan test

Chao-Wen Tzeng, Shi-Yu Huang. QC-Fill: An X-Fill method for quick-and-cool scan test. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 1142-1147, IEEE, 2009. [doi]

Abstract

Abstract is missing.