Feifei He - researchr alias

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Viewing Publication 1 - 11 from 11

2023

What social characteristics enhance recommender systems? The effects of network embeddedness and preference heterogeneityFeifei He, Chunhua Sun, Ye-Zheng Liu 0001. ecr, 23(3):1807-1827, September 2023. [doi]

A survey of high utility sequential patterns mining methodsRuihua Zhang, Meng Han, Feifei He, Fanxing Meng, Chunpeng Li. jifs, 45(5):8049-8077, November 2023. [doi]

2021

Schrödinger's Ballot: Quantum Information and the Violation of Arrow's Impossibility TheoremXin Sun 0001, Feifei He, Mirek Sopek, Meiyun Guo. entropy, 23(8):1083, 2021. [doi]

2020

A First Step to the Categorical Logic of Quantum ProgramsXin Sun 0001, Feifei He. entropy, 22(2):144, 2020. [doi]

Impossibility of Quantum Bit Commitment, a Categorical PerspectiveXin Sun 0001, Feifei He, Quanlong Wang. axioms, 9(1):28, 2020. [doi]

2016

Identifying micro-inversions using high-throughput sequencing readsFeifei He, Yang Li, Yu-Hang Tang, Jian Ma, Huaiqiu Zhu. bmcgenomics, 17(S-1):4, 2016. [doi]

Interconnect Reliability Analysis for Power Amplifier Based on Artificial Neural NetworksQian Lin, Haipeng Fu, Feifei He, Qian-Fu Cheng. et, 32(4):481-489, 2016. [doi]

2012

Electromigration reliability of interconnections in RF low noise amplifier circuitFeifei He, Cher Ming Tan. mr, 52(2):446-454, 2012. [doi]

Effect of IC layout on the reliability of CMOS amplifiersFeifei He, Cher Ming Tan. mr, 52(8):1575-1580, 2012. [doi]

2010

Modeling the effect of barrier thickness and low-k dielectric on circuit reliability using 3D modelFeifei He, Cher Ming Tan. mr, 50(9-11):1327-1331, 2010. [doi]

Circuit level interconnect reliability study using 3D circuit modelFeifei He, Cher Ming Tan. mr, 50(3):376-390, 2010. [doi]

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