Yasuo Nakagawa - researchr alias

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Viewing Publication 1 - 13 from 13

2009

Development of an Enterprise-Wide Yield Management System Using Critical Area Analysis for High-Product-Mix Semiconductor ManufacturingYuichi Hamamura, Chizu Matsumoto, Yoshiyuki Tsunoda, Koji Kamoda, Yoshio Iwata, Kenji Kanamitsu, Daisuke Fujiki, Fujihiko Kojika, Hiromi Fujita, Yasuo Nakagawa, Shun ichi Kaneko. ieicet, 92-C(1):144-152, 2009. [doi]

1994

Precise visual inspection for LSI wafer patterns using subpixel image alignmentTakashi Hiroi, Shunji Maeda, Hitoshi Kubota, Kenji Watanabe, Yasuo Nakagawa. wacv 1994: 26-34 [doi]

Shape from FocusShree K. Nayar, Yasuo Nakagawa. pami, 16(8):824-831, 1994. [doi]

1992

Development of Solder Joint Inspection Method Using Air Stimulation Speckle Vibration Detection Method and Fluorescence Detection MethodTakashi Hiroi, Kazushi Yoshimura, Takanori Ninomiya, Toshimitsu Hamada, Yasuo Nakagawa, Shigeki Mio, Kouichi Karasaki, Hideaki Sasaki. mva 1992: 429-434 [doi]

Automatic screen-printed circuit pattern inspection using connectivity preserving image reduction and connectivity comparisonTakanori Ninomiya, Kazushi Yoshimura, Mineo Nomoto, Yasuo Nakagawa. icpr 1992: 53-56 [doi]

1990

1989

Automatic 2 1/2 D shape inspection system for via-hole fillings of green sheets by shadow image analysisTakanori Ninomiya, Mineo Nomoto, Yasuo Nakagawa. icra 1989: 515-520 [doi]

1988

Precise Visual Inspection Algorithm for LSI Wafer Patterns Using Grayscale Image ComparisonYukio Matsuyama, Hisafumi Iwata, Hitoshi Kubota, Yasuo Nakagawa. mva 1988: 401-404 [doi]

1979

Some experiments on variable thresholdingYasuo Nakagawa, Azriel Rosenfeld. PR, 11(3):191-204, 1979. [doi]

A note on polygonal and elliptical approximation of mechanical partsYasuo Nakagawa, Azriel Rosenfeld. PR, 11(2):133-142, 1979. [doi]

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