Yingqi Ma - researchr alias

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Viewing Publication 1 - 5 from 5

2022

Design of Integrated Circuit Hard Defect Location System Based on Thermal Laser StimulationWenjian Wu, Yingqi Ma, Minghui Cai. apccas 2021: 536-540 [doi]

Design of SEL Self-Recovery Hardness for 90nm COTS Devices Using R-C-S Network with DC-DC ConverterJindou Xin, Xiang Zhu, Yingqi Ma, Jianwei Han. apccas 2021: 583-587 [doi]

2020

Research on the influences of well structure on dose rate effects in 65nm CMOS circuitQian Chen, Jianwei Han, Yingqi Ma, Sai Li, Jingtian Liu, Yaqing Chi, Bin Liang. ieiceee, 17(14):20200205, 2020. [doi]

Study on the single-event upset sensitivity of 65-nm CMOS sequential logic circuitSai Li, Jianwei Han, Rui Chen, Shipeng Shangguan, Yingqi Ma, Xuan Wang. ieiceee, 17(10):20200102, 2020. [doi]

2017

Comparison of single-event upset generated by heavy ion and pulsed laserBin Liang, Ruiqiang Song, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan. chinaf, 60(7), 2017. [doi]

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