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| 0 | -- | 0 | Pengcheng Huang, Shuming Chen, Jianjun Chen. Single event upset induced by single event double transient and its well-structure dependency in 65-nm bulk CMOS technology |
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| 0 | -- | 0 | Feng Wang, Mingxing Luo, Hui-Ran Li, Zhiguo Qu, Xiaojun Wang. Improved quantum ripple-carry addition circuit |
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