Journal: IEEE Computer

Volume 29, Issue 11

28 -- 30Rohit Kapur, Edward F. Miller. System Test and Reliability: Techniques for Avoiding Failure (Guest Editors Introduction)
32 -- 38Brian T. Murray, John P. Hayes. Testing ICs: Getting to the Core of the Problem
39 -- 45Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie. Built-In Self-Test: Assuring System Integrity
47 -- 53Deborah T. Marr, Subramanian Natarajan, Shreekant S. Thakkar, Richard Zucker. Multiprocessor Validation of the Pentium Pro
54 -- 60Joseph A. Profeta III, Nikos P. Andrianos, Bing Yu, Barry W. Johnson, Todd A. DeLong, David Guaspari, Damir Jamsek. Safety-Critical Systems Built with COTS
61 -- 68John D. Musa. Software-Reliability-Engineered Testing
69 -- 77Alan Wood. Predicting Software Reliability
78 -- 87Thomas Drake. Measuring Software Quality: A Case Study