| 3 | -- | 0 | . EIC Message |
| 4 | -- | 5 | William H. Joyner Jr., Andrew B. Kahng. Guest Editor s Introduction: Roadmaps and Visions for Design and Test |
| 6 | -- | 11 | . Perspectives |
| 12 | -- | 22 | Dennis Sylvester, Himanshu Kaul. Power-Driven Challenges in Nanometer Design |
| 23 | -- | 33 | Alberto L. Sangiovanni-Vincentelli, Grant Martin. Platform-Based Design and Software Design Methodology for Embedded Systems |
| 34 | -- | 46 | Ralf Brederlow, Werner Weber, Joseph Sauerer, Stéphane Donnay, Piet Wambacq, Maarten Vertregt. A Mixed-Signal Design Roadmap |
| 47 | -- | 54 | Rohit Kapur, R. Chandramouli, Thomas W. Williams. Strategies for Low-Cost Test |
| 56 | -- | 62 | Kevin Stanley. High-Accuracy Flush-and-Scan Software Diagnostic |
| 70 | -- | 79 | . Annual Index |
| 80 | -- | 0 | . The Last Byte |