External Links

    Journal: IEEE Design & Test of Computers

    Volume 2, Issue 3

    20 -- 28Gordon H. Bowers Jr., Bruce G. Pratt. Low-Cost Testers: Are They Really Low Cost?
    29 -- 34Anthony P. van den Heuvel, Noshir F. Khory. A Basis for Setting Burn-in Yield Criteria
    35 -- 44John R. Day. A Fault-Driven, Comprehensive Redundancy Algorithm
    45 -- 55Dean Bandes. Exploratory Data Analysis for Semiconductor Manufacturing
    56 -- 63Douglas K. Shirachi. Codec Testing Using Synchronized Analog And Digital Signals
    64 -- 72Thomas G. Szymanski, Christopher J. Van Wyk. Goalie: A Space Efficient System for VLSI Artwork Analysis
    101 -- 103Conrad Zagwyn. New Products Test
    104 -- 107J. Daniel Nash. New Products Design
    110 -- 0Robert E. Anderson. Book Reviews
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