External Links

    Journal: IEEE Design & Test of Computers

    Volume 2, Issue 6

    13 -- 26John Paul Shen, Wojciech Maly, F. Joel Ferguson. Inductive Fault Analysis of MOS Integrated Circuits
    27 -- 35Peter Odryna, Andrzej J. Strojwas. PROD: A VLSI Fault Diagnosis System
    36 -- 43Kofi E. Torku, Dave A. Kiesling. Noise Problems in Testing VLSI Hardware
    44 -- 49Tim Moore, Stephen Garner. Autoprobing on the L200 Functional Tester
    50 -- 56David F. Farnholtz. Operational Life Testing of Electronic Components
    57 -- 62Wayne Ponik. Teradyne's J967 VLSI Test System: Getting VLSI to the Market on Time
    runs on