| 261 | -- | 0 | Kwang-Ting (Tim) Cheng. Vision from the Top |
| 262 | -- | 265 | Mitra Subhasish, Ondrej Novák, Hana Kubatova, Bashir M. Al-Hashimi, Erik Jan Marinissen, C. P. Ravikumar. Conference Reports |
| 268 | -- | 277 | Alberto Valdes-Garcia, José Silva-Martínez, Edgar Sánchez-Sinencio. On-Chip Testing Techniques for RF Wireless Transceivers |
| 278 | -- | 293 | Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel. Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method |
| 294 | -- | 303 | Nur A. Touba. Survey of Test Vector Compression Techniques |
| 304 | -- | 310 | Walden C. Rhines. Sociology of Design and EDA |
| 315 | -- | 0 | Ajay Khoche. Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges |
| 316 | -- | 317 | Victor Berman. Standards: The P1685 IP-XACT IP Metadata Standard |
| 318 | -- | 319 | Sachin S. Sapatnekar. Book Reviews: Plumbing the Depths of Leakage |
| 320 | -- | 323 | Bruce C. Kim. Test Technology TC Newsletter |
| 322 | -- | 325 | . CEDA Currents |
| 328 | -- | 0 | Scott Davidson. Who Reads This Stuff Anyway? |