Journal: IEEE Design & Test of Computers

Volume 24, Issue 4

300 -- 0Tim Cheng. Design and CAD for Nanotechnologies
302 -- 303Fabrizio Lombardi, Cecilia Metra. Guest Editors Introduction: The State of the Art in Nanoscale CAD
304 -- 311Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi. An Overview of Nanoscale Devices and Circuits
312 -- 321Smita Krishnaswamy, Igor L. Markov, John P. Hayes. Tracking Uncertainty with Probabilistic Logic Circuit Testing
322 -- 330Kyung Ki Kim, Yong-Bin Kim, Minsu Choi, Nohpill Park. Leakage Minimization Technique for Nanoscale CMOS VLSI
332 -- 339Salem Abdennadher, Saghir A. Shaikh. Practices in Mixed-Signal and RF IC Testing
340 -- 350Arthur Pereira Frantz, Maico Cassel, Fernanda Lima Kastensmidt, Érika F. Cota, Luigi Carro. Crosstalk- and SEU-Aware Networks on Chips
352 -- 361Federico Di Palma, Giuseppe De Nicolao, Guido Miraglia, Oliver M. Donzelli. ACID: Automatic Sort-Map Classification for Interactive Process Diagnosis
362 -- 372Donghwi Lee, Erik H. Volkerink, Intaik Park, Jeff Rearick. Empirical Validation of Yield Recovery Using Idle-Cycle Insertion
374 -- 384V. R. Devanathan, C. P. Ravikumar, V. Kamakoti. Variation-Tolerant, Power-Safe Pattern Generation
386 -- 396Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu. Raisin: Redundancy Analysis Algorithm Simulation
402 -- 403Sachin S. Sapatnekar. Book Review: An Assay of Biochips
404 -- 405Joe Damore. DATC Newsletter
407 -- 0Bruce C. Kim. TTTC Newsletter
408 -- 0Scott Davidson. How do we train today s students to become tomorrow s engineers?