Journal: IEEE Design & Test of Computers

Volume 25, Issue 3

204 -- 0Tim Cheng. Effective silicon debug is key for time to money
206 -- 207Rob Aitken, Erik Jan Marinissen. Guest Editors Introduction: Addressing the Challenges of Debug and Diagnosis
208 -- 215Bart Vermeulen. Functional Debug Techniques for Embedded Systems
216 -- 223Miron Abramovici. In-System Silicon Validation and Debug
224 -- 230. Case Study on Speed Failure Causes in a Microprocessor
232 -- 239Pouria Bastani, Li-C. Wang, Magdy S. Abadir. Linking Statistical Learning to Diagnosis
240 -- 248Yu Huang, Ruifeng Guo, Wu-Tung Cheng, James Chien-Mo Li. Survey of Scan Chain Diagnosis
250 -- 257Christian Boit, Rudolf Schlangen, Uwe Kerst, Ted Lundquist. Physical Techniques for Chip-Backside IC Debug in Nanotechnologies
258 -- 267Bart Vermeulen, Neal Stollon, Rolf Kühnis, Gary Swoboda, Jeff Rearick. Overview of Debug Standardization Activities
272 -- 278David Yeh, Li-Shiuan Peh, Shekhar Borkar, John A. Darringer, Anant Agarwal, Wen-mei Hwu. Thousand-Core Chips [Roundtable]
284 -- 285Grant Martin. Learning to assert yourself [review of Creating Assertion-Based IP (H.D. Foster and A.C. Krolnik; 2008)]
288 -- 0Erik Jan Marinissen. Bugs, moths, grasshoppers, and whales