Journal: IEEE Design & Test of Computers

Volume 26, Issue 2

6 -- 7Yervant Zorian. Guest Editor s Introduction: Examples of Management Decision Criteria
8 -- 13Brad Beavers. The Story behind the Intel Atom Processor Success
14 -- 19Andrew Chang. Case Study of a 65-nm SoC Design
20 -- 29Jean-Pierre Schoellkopf, Philippe Magarshack. Low-Power Design Solutions forWireless Multimedia SoCs
30 -- 33Manuel d Abreu. From Specification to High-Volume Production
34 -- 43Kai-Hui Chang, David A. Papa, Igor L. Markov, Valeria Bertacco. Incremental Verification with Error Detection, Diagnosis, and Visualization
44 -- 51Wei Zhang. Computing and Minimizing Cache Vulnerability to Transient Errors
52 -- 63Andreas Apostolakis, Dimitris Gizopoulos, Mihalis Psarakis, Danilo Ravotto, Matteo Sonza Reorda. Test Program Generation for Communication Peripherals in Processor-Based SoC Devices
64 -- 73Li-Ming Denq, Yu-Tsao Hsing, Cheng-Wen Wu. Hybrid BIST Scheme for Multiple Heterogeneous Embedded Memories
76 -- 77Grant Martin. Processor Stew (review of Processor Description Languages by P. Mishra and N. Dutt, Eds.; 2008) [Book reviews]
84 -- 0Peggy Aycinena. Technical management: Best shaken, not stirred [The Last Byte]