| 6 | -- | 7 | Erik Jan Marinissen, Yervant Zorian. Guest Editors Introduction: The Status of IEEE Std 1500 |
| 8 | -- | 17 | Erik Jan Marinissen, Yervant Zorian. IEEE Std 1500 Enables Modular SoC Testing |
| 18 | -- | 25 | Benoit Nadeau-Dostie, Saman Adham, Russ Abbott. Improved Core Isolation and Access for Hierarchical Embedded Test |
| 26 | -- | 35 | Laung-Terng Wang, Ravi Apte, Shianling Wu, Boryau Sheu, Wen-Ben Jone, Jianghao Guo, Kuen-Jong Lee, Wei-Shin Wang, Xiaoqing Wen, Hao-Jan Chao, Jinsong Liu, Yanlong Niu, Yi-Chih Sung, Chi-Chun Wang, Fangfang Li. Turbo1500: Core-Based Design for Test and Diagnosis |
| 36 | -- | 43 | Rohit Kapur, Paul Reuter, Sandeep Bhatia, Brion L. Keller. CTL and Its Usage in the EDA Industry |
| 44 | -- | 51 | Teresa L. McLaurin, Stylianos Diamantidis, Irakis Diamantidis. The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper |
| 52 | -- | 59 | Kedarnath J. Balakrishnan, Grady Giles, James Wingfield. Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor |
| 60 | -- | 67 | Lucia Costas-Perez, Juan J. Rodríguez-Andina. Algorithmic Concurrent Error Detection in Complex Digital-Processing Systems |
| 68 | -- | 77 | Wenjing Rao, Alex Orailoglu, Ramesh Karri. Logic Mapping in Crossbar-Based Nanoarchitectures |
| 78 | -- | 87 | Timothée Levi, Jean Tomas, Noëlle Lewis, Pascal Fouillat. A CMOS Resizing Methodology for Analog Circuits |
| 88 | -- | 93 | Gadi Singer, Rajesh Galivanche, Srinivas Patil, Mike Tripp. The Challenges of Nanotechnology and Gigacomplexity |
| 98 | -- | 101 | Scott Davidson. A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)] |
| 104 | -- | 0 | Miron Abramovici, Al Crouch. We need more standards like IEEE 1500 |