Journal: IEEE Design & Test of Computers

Volume 27, Issue 2

6 -- 7Yu Cao, Frank Liu. Guest Editors Introduction: Compact Variability Modeling in Scaled CMOS Design
8 -- 16Samar K. Saha. Modeling Process Variability in Scaled CMOS Technology
18 -- 25Xi-Wei Lin, Victor Moroz. Layout Proximity Effects and Modeling Alternatives for IC Designs
26 -- 35Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov. Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP
36 -- 43Colin C. McAndrew, Xin Li, Ivica Stevanovic, Gennady Gildenblat. Extensions to Backward Propagation of Variance for Statistical Modeling
44 -- 50Darsen D. Lu, Chung-Hsun Lin, Ali M. Niknejad, Chenming Hu. Compact Modeling of Variation in FinFET SRAM Cells
51 -- 67Mohammad Tehranipoor, Kenneth M. Butler. Power Supply Noise: A Survey on Effects and Research
68 -- 74Robert K. Brayton, Jason Cong. NSF Workshop on EDA: Past, Present, and Future (Part 1)
75 -- 0Rohit Kapur. Conference Reports
82 -- 83Grant Martin. A career in system-level design research
84 -- 86Sani R. Nassif. Tis the gift to be simple