Journal: IEEE Design & Test of Computers

Volume 27, Issue 6

4 -- 5Swarup Bhunia, Rahul Rao. Guest Editors Introduction: Managing Uncertainty through Postfabrication Calibration and Repair
6 -- 17Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler. Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems
18 -- 25Wu-Hsin Chen, Byunghoo Jung. Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies
26 -- 35Minki Cho, Jason Schlessman, Hamid Mahmoodi, Marilyn Wolf, Saibal Mukhopadhyay. Postsilicon Adaptation for Low-Power SRAM under Process Variation
36 -- 45Rajiv V. Joshi, Rouwaida Kanj, Anthony Pelella, Arthur Tuminaro, Yuen Chan. The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane
46 -- 57Tsu-Wei Tseng, Jin-Fu Li, Chih-Sheng Hou. A Built-in Method to Repair SoC RAMs in Parallel
58 -- 68Mohammad Abdullah Al Faruque, Janmartin Jahn, Jörg Henkel. Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures
72 -- 73Scott Davidson. About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]
80 -- 0Stephen V. Kosonocky. Are you having fun yet?

Volume 27, Issue 5

6 -- 13Koh Johguchi, Akihiro Kaya, Shinya Izumi, Hans Jürgen Mattausch, Tetsushi Koide, Norio Sadachika. Measurement-Based Ring Oscillator Variation Analysis
14 -- 25David A. Papa, Michael D. Moffitt, Charles J. Alpert, Igor L. Markov. Speeding Up Physical Synthesis with Transactional Timing Analysis
26 -- 35Ewerson Luiz de Souza Carvalho, Ney Laert Vilar Calazans, Fernando Gehm Moraes. Dynamic Task Mapping for MPSoCs
36 -- 49Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook. A Common Language Framework for Next-Generation Embedded Testing
50 -- 59Alodeep Sanyal, Syed M. Alam, Sandip Kundu. BIST to Detect and Characterize Transient and Parametric Failures
68 -- 69Grant Martin. Spray-painting on the wall of EDA
80 -- 0Ron Press, Erik H. Volkerink. The ABCs of ITC

Volume 27, Issue 4

6 -- 9Partha Pratim Pande, Sriram R. Vangal. Guest Editors Introduction: Promises and Challenges of Novel Interconnect Technologies
10 -- 19Ron Ho, Frankie Liu, Dinesh Patil, Xuezhe Zheng, Guoliang Li, I. Shubin, E. Alon, Jon Lexau, Herb Schwetman, John E. Cunningham, Ashok V. Krishnamoorthy. Optical Interconnect for High-End Computer Systems
20 -- 31Hong Li, Chuan Xu, Kaustav Banerjee. Carbon Nanomaterials: The Ideal Interconnect Technology for Next-Generation ICs
32 -- 43Patrick Yin Chiang, Sirikarn Woracheewan, Changhui Hu, Lei Guo, Rahul Khanna, Jay J. Nejedlo, Huaping Liu. Short-Range, Wireless Interconnect within a Computing Chassis: Design Challenges
44 -- 53A. Nojeh, A. Ivanov. Wireless Interconnect and the Potential for Carbon Nanotubes
54 -- 67Zheng Li, Moustafa Mohamed, Hongyu Zhou, Li Shang, Alan Rolf Mickelson, Dejan Filipovic, Manish Vachharajani, Wounjhang Park, Yihe Sun. Global On-Chip Coordination at Light Speed
68 -- 69Igor L. Markov. Chips in 3D
70 -- 71Andrew B. Kahng. When is 3D 2B?
77 -- 0Rohit Kapur. Conference Reports
80 -- 0Radu Marculescu. On-chip networks: Two sides of the same coin

Volume 27, Issue 3

4 -- 19Mihalis Psarakis, Dimitris Gizopoulos, Edgar E. Sánchez, Matteo Sonza Reorda. Microprocessor Software-Based Self-Testing
20 -- 30Yu-Tsao Hsing, Li-Ming Denq, Chao-Hsun Chen, Cheng-Wen Wu. Economic Analysis of the HOY Wireless Test Methodology
31 -- 41Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou. Automatic Test Wrapper Synthesis for a Wireless ATE Platform
42 -- 53Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir. Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch
54 -- 61Manish Sharma, Chris Schuermyer, Brady Benware. Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis
62 -- 74Robert K. Brayton, Jason Cong. NSF Workshop on EDA: Past, Present, and Future (Part 2)
75 -- 0Rohit Kapur. Conference Reports
80 -- 81Scott Davidson. Concurrent checking for logic [review of New Methods of Concurrent Checking (Goessel, M., et al; 2008)]
86 -- 87Andrew B. Kahng. Scaling: More than Moore s law
88 -- 0Rob Aitken. Time to retire our benchmarks

Volume 27, Issue 2

6 -- 7Yu Cao, Frank Liu. Guest Editors Introduction: Compact Variability Modeling in Scaled CMOS Design
8 -- 16Samar K. Saha. Modeling Process Variability in Scaled CMOS Technology
18 -- 25Xi-Wei Lin, Victor Moroz. Layout Proximity Effects and Modeling Alternatives for IC Designs
26 -- 35Binjie Cheng, Daryoosh Dideban, Negin Moezi, Campbell Millar, Gareth Roy, Xingsheng Wang, Scott Roy, Asen Asenov. Statistical-Variability Compact-Modeling Strategies for BSIM4 and PSP
36 -- 43Colin C. McAndrew, Xin Li, Ivica Stevanovic, Gennady Gildenblat. Extensions to Backward Propagation of Variance for Statistical Modeling
44 -- 50Darsen D. Lu, Chung-Hsun Lin, Ali M. Niknejad, Chenming Hu. Compact Modeling of Variation in FinFET SRAM Cells
51 -- 67Mohammad Tehranipoor, Kenneth M. Butler. Power Supply Noise: A Survey on Effects and Research
68 -- 74Robert K. Brayton, Jason Cong. NSF Workshop on EDA: Past, Present, and Future (Part 1)
75 -- 0Rohit Kapur. Conference Reports
82 -- 83Grant Martin. A career in system-level design research
84 -- 86Sani R. Nassif. Tis the gift to be simple

Volume 27, Issue 1

8 -- 9Mohammad Tehranipoor, Farinaz Koushanfar. Guest Editors Introduction: Confronting the Hardware Trustworthiness Problem
10 -- 25Mohammad Tehranipoor, Farinaz Koushanfar. A Survey of Hardware Trojan Taxonomy and Detection
26 -- 35Yier Jin, Yiorgos Makris. Hardware Trojans in Wireless Cryptographic ICs
36 -- 47Kurt Rosenfeld, Ramesh Karri. Attacks and Defenses for JTAG
48 -- 65Meng-Day (Mandel) Yu, Srinivas Devadas. Secure and Robust Error Correction for Physical Unclonable Functions
66 -- 75Alex Baumgarten, Akhilesh Tyagi, Joseph Zambreno. Preventing IC Piracy Using Reconfigurable Logic Barriers
76 -- 85Lingkan Gong, Jingfen Lu. Verification-Purpose Operating System for Microprocessor System-Level Functions
93 -- 95Igor L. Markov. Master numerical tasks with ease
96 -- 98Miodrag Potkonjak. Variability: For headache and profit