| 4 | -- | 5 | Swarup Bhunia, Rahul Rao. Guest Editors Introduction: Managing Uncertainty through Postfabrication Calibration and Repair |
| 6 | -- | 17 | Vishwanath Natarajan, Shreyas Sen, Aritra Banerjee, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler. Analog Signature- Driven Postmanufacture Multidimensional Tuning of RF Systems |
| 18 | -- | 25 | Wu-Hsin Chen, Byunghoo Jung. Self-Healing Phase-Locked Loops in Deep-Scaled CMOS Technologies |
| 26 | -- | 35 | Minki Cho, Jason Schlessman, Hamid Mahmoodi, Marilyn Wolf, Saibal Mukhopadhyay. Postsilicon Adaptation for Low-Power SRAM under Process Variation |
| 36 | -- | 45 | Rajiv V. Joshi, Rouwaida Kanj, Anthony Pelella, Arthur Tuminaro, Yuen Chan. The Dawn of Predictive Chip Yield Design: Along and Beyond the Memory Lane |
| 46 | -- | 57 | Tsu-Wei Tseng, Jin-Fu Li, Chih-Sheng Hou. A Built-in Method to Repair SoC RAMs in Parallel |
| 58 | -- | 68 | Mohammad Abdullah Al Faruque, Janmartin Jahn, Jörg Henkel. Runtime Thermal Management Using Software Agents for Multi- and Many-Core Architectures |
| 72 | -- | 73 | Scott Davidson. About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)] |
| 80 | -- | 0 | Stephen V. Kosonocky. Are you having fun yet? |