| 4 | -- | 19 | Mihalis Psarakis, Dimitris Gizopoulos, Edgar E. Sánchez, Matteo Sonza Reorda. Microprocessor Software-Based Self-Testing |
| 20 | -- | 30 | Yu-Tsao Hsing, Li-Ming Denq, Chao-Hsun Chen, Cheng-Wen Wu. Economic Analysis of the HOY Wireless Test Methodology |
| 31 | -- | 41 | Chun-Yu Yang, Ying-Yen Chen, Sung-Yu Chen, Jing-Jia Liou. Automatic Test Wrapper Synthesis for a Wireless ATE Platform |
| 42 | -- | 53 | Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir. Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch |
| 54 | -- | 61 | Manish Sharma, Chris Schuermyer, Brady Benware. Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis |
| 62 | -- | 74 | Robert K. Brayton, Jason Cong. NSF Workshop on EDA: Past, Present, and Future (Part 2) |
| 75 | -- | 0 | Rohit Kapur. Conference Reports |
| 80 | -- | 81 | Scott Davidson. Concurrent checking for logic [review of New Methods of Concurrent Checking (Goessel, M., et al; 2008)] |
| 86 | -- | 87 | Andrew B. Kahng. Scaling: More than Moore s law |
| 88 | -- | 0 | Rob Aitken. Time to retire our benchmarks |