Journal: IEEE Design & Test of Computers

Volume 27, Issue 5

6 -- 13Koh Johguchi, Akihiro Kaya, Shinya Izumi, Hans Jürgen Mattausch, Tetsushi Koide, Norio Sadachika. Measurement-Based Ring Oscillator Variation Analysis
14 -- 25David A. Papa, Michael D. Moffitt, Charles J. Alpert, Igor L. Markov. Speeding Up Physical Synthesis with Transactional Timing Analysis
26 -- 35Ewerson Luiz de Souza Carvalho, Ney Laert Vilar Calazans, Fernando Gehm Moraes. Dynamic Task Mapping for MPSoCs
36 -- 49Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook. A Common Language Framework for Next-Generation Embedded Testing
50 -- 59Alodeep Sanyal, Syed M. Alam, Sandip Kundu. BIST to Detect and Characterize Transient and Parametric Failures
68 -- 69Grant Martin. Spray-painting on the wall of EDA
80 -- 0Ron Press, Erik H. Volkerink. The ABCs of ITC