Journal: IEEE Design & Test of Computers

Volume 28, Issue 6

6 -- 0Jiun-Lang Huang, Kwang-Ting (Tim) Cheng. A Promising Alternative to Conventional Silicon
8 -- 15Tsung-Ching Huang, Jiun-Lang Huang, Kwang-Ting (Tim) Cheng. Robust Circuit Design for Flexible Electronics
16 -- 23William Wong, Tse Nga Ng, Sanjiv Sambandan, Michael Chabinyc. Materials, Processing, and Testing of Flexible Image Sensor Arrays
24 -- 31Chester Liu, En-Hua Ma, Wen-En Wei, Chien-Mo James Li, I-Chun Cheng, Yung-Hui Yeh. Placement Optimization of Flexible TFT Digital Circuits
32 -- 40Yindar Chuo, Badr Omrane, Clinton K. Landrock, Jeydmer Aristizabal, Donna Hohertz, Sasan Vosoogh-Grayli, Bozena Kaminska. Powering the Future: Organic Solar Cells with Polymer Energy Storage
41 -- 49Peter Maxwell. Adaptive Testing: Dealing with Process Variability
50 -- 57Youngsoo Shin, Seungwhun Paik. Pulsed-Latch Circuits: A New Dimension in ASIC Design
58 -- 65Kirk A. Gray, Michael Pecht. Long-Term Thermal Overstressing of Computers
66 -- 75Dallas Webster, Rick Hudgens, Donald Y. C. Lie. Replacing Error Vector Magnitude Test with RF and Analog BISTs
76 -- 84Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma. RF Front-End Test Using Built-in Sensors
85 -- 87Bill Eklow. Major Milestones for Two IEEE Standards Groups in 2011
88 -- 89Andrew B. Kahng. Product Futures