External Links

    Journal: IEEE Design & Test of Computers

    Volume 3, Issue 5

    11 -- 15Kenneth P. Parker. Testability: Barriers to Acceptance
    17 -- 26Madhukar K. Reddy, Sudhakar M. Reddy. Detecting FET Stuck-Open Faults in CMOS Latches and Flip-Flops
    27 -- 37Sunil K. Jain, Charles E. Stroud. Built-in Self Testing of Embedded Memories
    39 -- 48E. Ted Grinthal. Software Quality Assurance And CAD User Interfaces
    49 -- 56David Hightower, Aart J. de Geus, Patrick Fasang, Robert Griffin, Gary Leive. Computer-Aided-Design Research at the GE Microelectronics Center
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