4 | -- | 0 | Jörg Henkel. New Directions in Analog/Mixed-Signal Design and Test |
5 | -- | 6 | Xin Li, Chandramouli Kashyap, Chris J. Myers. Guest Editors' Introduction Challenges and Opportunities in Analog/Mixed-Signal CAD |
7 | -- | 15 | Anirudh Iyengar, Swaroop Ghosh, Srikant Srinivasan. Retention Testing Methodology for STTRAM |
16 | -- | 27 | Jiho Lee, Jaeha Kim. Efficient Global Optimization of Analog Circuits Using Predictive Response Surface Models on Discretized Design Space |
28 | -- | 34 | Parijat Mukherjee, Peng Li. Using Presilicon Knowledge to Excite Nonlinear Failure Modes in Large Mixed-Signal Circuits |
35 | -- | 43 | Hafiz ul Asad, Kevin D. Jones. Verifying Inevitability of Oscillation in Ring Oscillators Using the Deductive SOS-QE Approach |
44 | -- | 55 | Vladimir Dubikhin, Danil Sokolov, Alex Yakovlev, Chris J. Myers. Design of Mixed-Signal Systems With Asynchronous Control |
56 | -- | 64 | Kai He, Xin Huang, Sheldon X.-D. Tan. EM-Based On-Chip Aging Sensor for Detection of Recycled ICs |
65 | -- | 74 | Rolf Ernst, Marco Di Natale. Mixed Criticality Systems - A History of Misconceptions? |
75 | -- | 83 | Farshad Khorrami, Prashanth Krishnamurthy, Ramesh Karri. Cybersecurity for Control Systems: A Process-Aware Perspective |
84 | -- | 91 | Magdy Abadir. Creating a Successful Partnership Between Industry, Academia, and Government |
93 | -- | 95 | Chuck Alpert. Recap of the 53rd Design Automation Conference (DAC) |
101 | -- | 103 | Theo Theocharides. Test Technology TC Newsletter |
104 | -- | 0 | Scott Davidson. Where Are We Going? |