Journal: IEEE Design & Test of Computers

Volume 33, Issue 5

4 -- 0Jörg Henkel. New Directions in Analog/Mixed-Signal Design and Test
5 -- 6Xin Li, Chandramouli Kashyap, Chris J. Myers. Guest Editors' Introduction Challenges and Opportunities in Analog/Mixed-Signal CAD
7 -- 15Anirudh Iyengar, Swaroop Ghosh, Srikant Srinivasan. Retention Testing Methodology for STTRAM
16 -- 27Jiho Lee, Jaeha Kim. Efficient Global Optimization of Analog Circuits Using Predictive Response Surface Models on Discretized Design Space
28 -- 34Parijat Mukherjee, Peng Li. Using Presilicon Knowledge to Excite Nonlinear Failure Modes in Large Mixed-Signal Circuits
35 -- 43Hafiz ul Asad, Kevin D. Jones. Verifying Inevitability of Oscillation in Ring Oscillators Using the Deductive SOS-QE Approach
44 -- 55Vladimir Dubikhin, Danil Sokolov, Alex Yakovlev, Chris J. Myers. Design of Mixed-Signal Systems With Asynchronous Control
56 -- 64Kai He, Xin Huang, Sheldon X.-D. Tan. EM-Based On-Chip Aging Sensor for Detection of Recycled ICs
65 -- 74Rolf Ernst, Marco Di Natale. Mixed Criticality Systems - A History of Misconceptions?
75 -- 83Farshad Khorrami, Prashanth Krishnamurthy, Ramesh Karri. Cybersecurity for Control Systems: A Process-Aware Perspective
84 -- 91Magdy Abadir. Creating a Successful Partnership Between Industry, Academia, and Government
93 -- 95Chuck Alpert. Recap of the 53rd Design Automation Conference (DAC)
101 -- 103Theo Theocharides. Test Technology TC Newsletter
104 -- 0Scott Davidson. Where Are We Going?