| 4 | -- | 0 | Jörg Henkel. Test for Automotive |
| 5 | -- | 6 | Hans-Joachim Wunderlich, Yervant Zorian. Guest Editor's Introduction |
| 7 | -- | 14 | Xabier Iturbe, Balaji Venu, Juergen Jagst, Emre Ozer, Peter Harrod, Chris Turner, John Penton. Addressing Functional Safety Challenges in Autonomous Vehicles with the Arm TCL S Architecture |
| 15 | -- | 23 | Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes |
| 24 | -- | 30 | Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits |
| 31 | -- | 38 | Chuchu Fan, Bolun Qi, Sayan Mitra. Data-Driven Formal Reasoning and Their Applications in Safety Analysis of Vehicle Autonomy Features |
| 39 | -- | 45 | Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima. Automotive Functional Safety Assurance by POST with Sequential Observation |
| 46 | -- | 53 | Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini. An Optimized Test During Burn-In for Automotive SoC |
| 54 | -- | 65 | Guoxing Wang, Xiyan Li, Miaorong Wang, Hang Yuan, Wei Xu. Optimization of a Dual-Band Wireless Power and Data Telemetry System Using Genetic Algorithm |
| 66 | -- | 72 | Alberto Bocca, Alberto Macii, Enrico Macii, Massimo Poncino. Composable Battery Model Templates Based on Manufacturers' Data |
| 73 | -- | 88 | Dimitrios N. Serpanos, Muhammad Taimoor Khan 0001, Howard E. Shrobe. Designing Safe and Secure Industrial Control Systems: A Tutorial Review |
| 89 | -- | 97 | David Yeh. Autonomous Systems and the Challenges in Verification, Validation, and Test |
| 98 | -- | 99 | Scott Davidson. Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing |
| 100 | -- | 101 | Youngsoo Shin. Recap of the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) |
| 102 | -- | 103 | Theo Theocharides. TTTC News |
| 104 | -- | 0 | Scott Davidson. Computers with Tailfins? |