Journal: IEEE Design & Test of Computers

Volume 35, Issue 6

4 -- 0Jörg Henkel. Managing Electric Vehicles
5 -- 7Naehyuck Chang, Zili Shao, Xin Li, Orkun Karabasoglu, Wende Zhang. Guest Editors' Introduction: Special Issue on Energy and Power Management for Electric Vehicles
8 -- 15Korosh Vatanparvar, Mohammad Abdullah Al Faruque. Path to Eco-Driving: Electric Vehicle HVAC and Route Joint Optimization
16 -- 24Alberto Bocca, Yukai Chen, Alberto Macii, Enrico Macii, Massimo Poncino. Aging and Cost Optimal Residential Charging for Plug-In EVs
25 -- 36M. Hadi Amini, Paul McNamara, Paul Weng, Orkun Karabasoglu, Yinliang Xu. Hierarchical Electric Vehicle Charging Aggregator Strategy Using Dantzig-Wolfe Decomposition
37 -- 43Caiwen Ding, Hongjia Li, Weiwei Zheng, Yanzhi Wang, Xue Lin. Reconfigurable Photovoltaic Systems for Electric Vehicles
44 -- 70Naehyuck Chang, Mohammad Al Faruque, Zili Shao, Chun Jason Xue, Yiran Chen, Donkyu Baek. Survey of Low-Power Electric Vehicles: A Design Automation Perspective
71 -- 77Weifeng Liu, Yiyong Yang, Chuankun Han, Linhong Ji, Jia Cheng. Measuring System Design and Experimental Research on Electrostatic Attractive Force
78 -- 85M. Amin Sabet, Behnam Ghavami, Mohsen Raji. GPU-Accelerated Soft Error Rate Analysis of Large-Scale Integrated Circuits
86 -- 93X. Sharon Hu, Rolf Ernst, Petru Eles, Gernot Heiser, Kurt Keutzer, Daehyun Kim, Tetsuya Tohdo. Roundtable: Machine Learning for Embedded Systems: Hype or Lasting Impact?
94 -- 95Jaydeep Kulkarni, Thomas F. Wenisch. Report on the 2018 IEEE/ACM International Symposium on Low Power Electronics and Design
96 -- 97Yervant Zorian. The 10th China Test Conference
98 -- 99Theo Theocharides. TTTC Newsletter
100 -- 0Scott Davidson. Running on Empty

Volume 35, Issue 5

4 -- 0Jörg Henkel. Self-Awareness in Systems on Chip, Part II
5 -- 6Nikil D. Dutt, Axel Jantsch. Guest Editorial: Special Issue on Self-Aware Systems on Chip
7 -- 18Michael A. Kochte, Hans-Joachim Wunderlich. Self-Test and Diagnosis for Self-Aware Systems
19 -- 27Adam Kostrzewa, Sebastian Tobuschat, Rolf Ernst. Self-Aware Network-on-Chip Control in Real-Time Systems
28 -- 35Andrea Bartolini, Roberto Diversi, Daniele Cesarini, Francesco Beneventi. Self-Aware Thermal Management for High-Performance Computing Processors
36 -- 44Mohammad Salehi, Alireza Ejlali, Muhammad Shafique 0001. Run-Time Adaptive Power-Aware Reliability Management for Manycores
45 -- 53Alfonso Alongi, Giuseppe Vitello, Salvatore Vitabile, Vincenzo Conti. An Empirical Set of Metrics for Embedded Systems Testing
54 -- 62Pietro Fezzardi, Fabrizio Ferrandi, Christian Pilato. Enabling Automated Bug Detection for IP-Based Designs Using High-Level Synthesis
63 -- 74Felix C. Freiling, Tobias Grob, Tobias Latzo, Tilo Müller, Ralph Palutke. Advances in Forensic Data Acquisition
75 -- 77Xiaobo Sharon Hu. The 55th Design Automation Conference
78 -- 79Theo Theocharides. TTTC Newsletter
80 -- 0Scott Davidson. Self-Test and Self-Aware

Volume 35, Issue 4

4 -- 0Jörg Henkel. Time-Critical Systems Design, Part II
5 -- 6Tulika Mitra, Jürgen Teich, Lothar Thiele. Guest Editors' Introduction: Special Issue on Time-Critical Systems Design Part II
7 -- 15Stefanos Skalistis, Federico Angiolini, Giovanni De Micheli, Alena Simalatsar. Safe and Efficient Deployment of Data-Parallelizable Applications on Many-Core Platforms: Theory and Practice
16 -- 22Leonie Ahrendts, Rolf Ernst, Sophie Quinton. Exploiting Execution Dynamics in Timing Analysis Using Job Sequences
23 -- 30Gonzalo Carvajal, Mahmoud Salem, Nirmal Benann, Sebastian Fischmeister. Enabling Rapid Construction of Arrival Curves From Execution Traces
31 -- 37Jean-Luc Béchennec, Sébastien Faucou, Olivier H. Roux, Matthias Brun, Louis-Marie Givel. Testing Real-Time Systems With Runtime Enforcement
38 -- 46Amir Aminifar, Petru Eles, Zebo Peng, Anton Cervin, Karl-Erik Årzén. Control-Quality-Driven Design of Embedded Control Systems with Stability Guarantees
47 -- 55Mohamed Hassan. Heterogeneous MPSoCs for Mixed-Criticality Systems: Challenges and Opportunities
56 -- 64Hari Mohan Gaur, Ashutosh Kumar Singh, Umesh Ghanekar. Testable Design of Reversible Circuits Using Parity Preserving Gates
65 -- 74Sana Mazahir, Osman Hasan, Muhammad Shafique 0001. Adaptive Approximate Computing in Arithmetic Datapaths
75 -- 77Jan Madsen, Ayse Kivilcim Coskun. Report on DATE 2018 in Dresden, Germany
78 -- 79Theo Theocharides. TTTC News
80 -- 0Scott Davidson. The Joy of Scheduling

Volume 35, Issue 3

4 -- 0Jörg Henkel. Test for Automotive
5 -- 6Hans-Joachim Wunderlich, Yervant Zorian. Guest Editor's Introduction
7 -- 14Xabier Iturbe, Balaji Venu, Juergen Jagst, Emre Ozer, Peter Harrod, Chris Turner, John Penton. Addressing Functional Safety Challenges in Autonomous Vehicles with the Arm TCL S Architecture
15 -- 23Baris Esen, Anthony Coyette, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. An Automated Low-Cost Analog and Mixed-Signal DfT Method Using Testing Diodes
24 -- 30Anthony Coyette, Baris Esen, Nektar Xama, Georges G. E. Gielen, Wim Dobbelaere, Ronny Vanhooren. ADAGE: Automatic DfT-Assisted Generation of Test Stimuli for Mixed- Signal Integrated Circuits
31 -- 38Chuchu Fan, Bolun Qi, Sayan Mitra. Data-Driven Formal Reasoning and Their Applications in Safety Analysis of Vehicle Autonomy Features
39 -- 45Senling Wang, Yoshinobu Higami, Hiroshi Takahashi, Hiroyuki Iwata, Jun Matsushima. Automotive Functional Safety Assurance by POST with Sequential Observation
46 -- 53Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez 0001, Federico Venini. An Optimized Test During Burn-In for Automotive SoC
54 -- 65Guoxing Wang, Xiyan Li, Miaorong Wang, Hang Yuan, Wei Xu. Optimization of a Dual-Band Wireless Power and Data Telemetry System Using Genetic Algorithm
66 -- 72Alberto Bocca, Alberto Macii, Enrico Macii, Massimo Poncino. Composable Battery Model Templates Based on Manufacturers' Data
73 -- 88Dimitrios N. Serpanos, Muhammad Taimoor Khan 0001, Howard E. Shrobe. Designing Safe and Secure Industrial Control Systems: A Tutorial Review
89 -- 97David Yeh. Autonomous Systems and the Challenges in Verification, Validation, and Test
98 -- 99Scott Davidson. Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing
100 -- 101Youngsoo Shin. Recap of the 23rd Asia and South Pacific Design Automation Conference (ASP-DAC)
102 -- 103Theo Theocharides. TTTC News
104 -- 0Scott Davidson. Computers with Tailfins?

Volume 35, Issue 2

4 -- 0Jörg Henkel. From the EIC: Time-Critical Systems Design
5 -- 7Tulika Mitra, Jürgen Teich, Lothar Thiele. Guest Editors' Introduction: Special Issue on Time-Critical Systems Design
8 -- 26Tulika Mitra, Jürgen Teich, Lothar Thiele. Time-Critical Systems Design: A Survey
27 -- 30Gernot Heiser. For Safety's Sake: We Need a New Hardware-Software Contract!
31 -- 37Sanjoy Baruah. Mixed-Criticality Scheduling Theory: Scope, Promise, and Limitations
38 -- 47Martin Schoeberl, Luca Pezzarossa, Jens Sparsø. A Multicore Processor for Time-Critical Applications
48 -- 56Francisco J. Cazorla, Jaume Abella, Enrico Mezzetti, Carles Hernández, Tullio Vardanega, Guillem Bernat. Reconciling Time Predictability and Performance in Future Computing Systems
57 -- 63Josef Strnadel. Predictability Analysis of Interruptible Systems by Statistical Model Checking
64 -- 72Edward A. Lee. What Is Real Time Computing? A Personal View
73 -- 90Sophie Dupuis, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre. Protection Against Hardware Trojans With Logic Testing: Proposed Solutions and Challenges Ahead
91 -- 99Dongjun Xu, Ningmei Yu, Hantao Huang, Sai Manoj Pudukotai Dinakarrao, Hao Yu. Q-Learning-Based Voltage-Swing Tuning and Compensation for 2.5-D Memory-Logic Integration
101 -- 102Sri Parameswaran, R. Iris Bahar, David Z. Pan. Conference Reports: Report on the 2017 International Conference on Computer-Aided Design (ICCAD)
103 -- 104Jin-Fu Li, Jiun-Lang Huang. Conference Reports: Report on 2017 IEEE Asian Test Symposium
106 -- 107Theo Theocharides. TTTC Newsletter
108 -- 0Taeweon Suh. Correction
109 -- 0Scott Davidson. The Last Byte: Real Time, Real People

Volume 35, Issue 1

4 -- 0Jörg Henkel. Design and Test of Energy-Efficient, High-Performance, and Secure Computing Technologies via Accelerators
5 -- 6Mustafa Ozdal, Gi-Joon Nam, Debbie Marr. Guest Editors' Introduction: Hardware Accelerators for Data Centers
7 -- 15Christian Brugger, Valentin Grigorovici, Matthias Jung 0001, Christian de Schryver, Christian Weis, Norbert Wehn, Katharina Anna Zweig. A Memory Centric Architecture of the Link Assessment Algorithm in Large Graphs
16 -- 22Jason Cong, Zhenman Fang, Muhuan Huang, Libo Wang, Di Wu 0010. CPU-FPGA Coscheduling for Big Data Applications
23 -- 29Naif Tarafdar, Nariman Eskandari, Thomas Lin, Paul Chow. Designing for FPGAs in the Cloud
30 -- 38Boeui Hong, Han-Yee Kim, Minsu Kim, Taeweon Suh, Lei Xu 0012, Weidong Shi. FASTEN: An FPGA-Based Secure System for Big Data Processing
39 -- 46Dongyoung Kim, Junwhan Ahn, Sungjoo Yoo. ZeNA: Zero-Aware Neural Network Accelerator
47 -- 54Muhammet Mustafa Ozdal. Emerging Accelerator Platforms for Data Centers
55 -- 62Young-Ho Gong, Jae Jeong Yoo, Sung Woo Chung. Thermal Modeling and Validation of a Real-World Mobile AP
63 -- 73Yen-Long Lee, Yu-Po Cheng, Soon-Jyh Chang, Hsin-Wen Ting. A Fast and Jitter-Modulation Free Jitter Tolerance Estimation Technique for Bang- Bang CDRs
74 -- 89Elke De Mulder, Thomas Eisenbarth, Patrick Schaumont. Identifying and Eliminating Side-Channel Leaks in Programmable Systems
90 -- 94Dimitrios N. Serpanos. Secure and Resilient Industrial Control Systems
95 -- 96Lothar Thiele, Soonhoi Ha. The 2017 Embedded Systems Week (ESWEEK)
97 -- 98Ibrahim Abe M. Elfadel, H. Fatih Ugurdag. 25th IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2017)
99 -- 101José L. Ayala. CEDA Currents
102 -- 103Theo Theocharides. TTTC Newsletter
104 -- 0Scott Davidson. Technobabble