Journal: IEEE Design & Test of Computers

Volume 35, Issue 5

4 -- 0Jörg Henkel. Self-Awareness in Systems on Chip, Part II
5 -- 6Nikil D. Dutt, Axel Jantsch. Guest Editorial: Special Issue on Self-Aware Systems on Chip
7 -- 18Michael A. Kochte, Hans-Joachim Wunderlich. Self-Test and Diagnosis for Self-Aware Systems
19 -- 27Adam Kostrzewa, Sebastian Tobuschat, Rolf Ernst. Self-Aware Network-on-Chip Control in Real-Time Systems
28 -- 35Andrea Bartolini, Roberto Diversi, Daniele Cesarini, Francesco Beneventi. Self-Aware Thermal Management for High-Performance Computing Processors
36 -- 44Mohammad Salehi, Alireza Ejlali, Muhammad Shafique 0001. Run-Time Adaptive Power-Aware Reliability Management for Manycores
45 -- 53Alfonso Alongi, Giuseppe Vitello, Salvatore Vitabile, Vincenzo Conti. An Empirical Set of Metrics for Embedded Systems Testing
54 -- 62Pietro Fezzardi, Fabrizio Ferrandi, Christian Pilato. Enabling Automated Bug Detection for IP-Based Designs Using High-Level Synthesis
63 -- 74Felix C. Freiling, Tobias Grob, Tobias Latzo, Tilo Müller, Ralph Palutke. Advances in Forensic Data Acquisition
75 -- 77Xiaobo Sharon Hu. The 55th Design Automation Conference
78 -- 79Theo Theocharides. TTTC Newsletter
80 -- 0Scott Davidson. Self-Test and Self-Aware