Journal: IEEE Design & Test of Computers

Volume 36, Issue 1

4 -- 0Jörg Henkel. From the EIC: Special Section on Test
5 -- 13Jack Tang, Mohamed Ibrahim, Krishnendu Chakrabarty. Randomized Checkpoints: A Practical Defense for Cyber-Physical Microfluidic Systems
14 -- 22Ulbert J. Botero, Mark M. Tehranipoor, Domenic Forte. Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement
23 -- 30Shufan Yang, Zheqi Yu. A Highly Integrated Hardware/Software Co-Design and Co-Verification Platform
31 -- 39Luis Pizano-Escalante, Omar Longoria-Gandara, Ramón Parra-Michel, F. Peña-Campos. Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects
40 -- 47Donkyu Baek, Naehyuck Chang, Jaemin Kim. Build Your Own EV: A Rapid Energy-Aware Synthesis of Electric Vehicles
48 -- 56Seetal Potluri, Paul Pop, Jan Madsen. Design-for-Testability of On-Chip Control in mVLSI Biochips
57 -- 64Donkyu Baek, Hyung Gyu Lee, Naehyuck Chang. SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter
65 -- 67Rajesh K. Gupta 0001, Subhasish Mitra, Puneet Gupta. Variability Expeditions: A Retrospective
68 -- 69Soonhoi Ha, Petru Eles. 2018 Embedded Systems Week (ESWEEK) in Torino
70 -- 71Theo Theocharides. TTTC Newsletter
72 -- 0Scott Davidson. Is This a System?