Journal: IEEE Design & Test of Computers

Volume 38, Issue 4

4 -- 0Jörg Henkel. Machine Intelligence at the Edge
5 -- 6Luca Benini, Deming Chen, Jinjun Xiong, Zhiru Zhang. Guest Editors' Introduction: Machine Intelligence at the Edge
7 -- 26Cong Hao, Jordan Dotzel, Jinjun Xiong, Luca Benini, Zhiru Zhang, Deming Chen. Enabling Design Methodologies and Future Trends for Edge AI: Specialization and Codesign
27 -- 36Jeff Anderson, Yousra Alkabani, Tarek A. El-Ghazawi. Toward Energy-Quality Scaling in Deep Neural Networks
37 -- 43Kartikeya Bhardwaj, Naveen Suda, Radu Marculescu. EdgeAl: A Vision for Deep Learning in the IoT Era
44 -- 51Daniela De Venuto, Giovanni Mezzina. Multisensing System for Parkinson's Disease Stage Assessment Based on FPGA-Embedded Serial SVM Classifier
52 -- 59Boyu Zhang 0001, Azadeh Davoodi, Yu Hen Hu. A Mixture of Experts Approach for Low-Cost DNN Customization
60 -- 61Marcelo Lubaszewki, Matteo Sonza Reorda. Guest Editors' Introduction: SBCCI 2019
62 -- 69Alzemiro Lucas da Silva, Iacana Ianiski Weber, André Luís Del Mestre Martins, Fernando Gehm Moraes. Hardware Accelerator for Runtime Temperature Estimation in Many-Cores
70 -- 77Anderson Camargo Sant'Ana, Henrique Martins Medina, Fernando Gehm Moraes. Security Vulnerabilities and Countermeasures in MPSoCs
78 -- 84Alexandre A. A. de Almeida, Gerhard W. Dueck. Adaptive Integer Linear Programming Model for Optimal Qubit Permutation
85 -- 93Lucas A. Lascasas Freitas, João G. Nizer Rahmeier, Omar P. Vilela Neto. Shape Engineering for Custom Nanomagnetic Logic Circuits in NMLSim 2.0
94 -- 101Renan A. Marks, Daniel K. S. Vieira, Marcos V. Guterres, Poliana A. C. Oliveira, Maria C. O. Fonte Boa, Omar P. Vilela Neto. Design and Test of Digital Logic DNA Systems
102 -- 108Arunmozhi Manimuthu, Venugopal Dharshini. Framework for Load Power Consumption in HANs Using Machine Learning and IoT Assistance
109 -- 118Samuel Pagliarini, Joseph Sweeney, Ken Mai, R. D. Shawn Blanton, Larry T. Pileggi, Subhasish Mitra. Split-Chip Design to Prevent IP Reverse Engineering
119 -- 126Yi-Hsin Wu, Jui-Yu Huang, Yi-Chun Yao, Yin-Jing Tien, Cheng-Juei Yu, Sheng-De Wang. Detecting and Scoring Equipment Faults in Real Time During Semiconductor Test Processes
128 -- 130Franco Fummi, Ian O'Connor. Holding Conferences Online in Pandemic Times: The DATE Experience
133 -- 134Theo Theocharides. TTTC News
136 -- 0Scott Davidson. Being Learned