12 | -- | 20 | Randall Kramer. Testing Mixed-Signal Devices |
22 | -- | 30 | Mark R. Barber, Walter I. Satre. Timing Accuracy in Modern ATE |
32 | -- | 38 | John A. Waicukauski, Eric Lindbloom, Barry K. Rosen, Vijay S. Iyengar. Transition Fault Simulation |
39 | -- | 45 | Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke. Aliasing Errors in Signature Analysis Registers |
46 | -- | 54 | Alexander Miczo, Dipti Mohapatra, Scott Perkins, Katie Kaufman, Ken Huang. The Effects of Modeling on Simulator Performance |