Journal: IEEE Design & Test of Computers

Volume 4, Issue 2

12 -- 20Randall Kramer. Testing Mixed-Signal Devices
22 -- 30Mark R. Barber, Walter I. Satre. Timing Accuracy in Modern ATE
32 -- 38John A. Waicukauski, Eric Lindbloom, Barry K. Rosen, Vijay S. Iyengar. Transition Fault Simulation
39 -- 45Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke. Aliasing Errors in Signature Analysis Registers
46 -- 54Alexander Miczo, Dipti Mohapatra, Scott Perkins, Katie Kaufman, Ken Huang. The Effects of Modeling on Simulator Performance