External Links

    Journal: IBM Journal of Research and Development

    Volume 28, Issue 2

    124 -- 134Chin-Long Chen, M. Y. (Ben) Hsiao. Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review
    135 -- 149Glen G. Langdon Jr.. An Introduction to Arithmetic Coding
    150 -- 158Richard E. Blahut. A Universal Reed-Solomon Decoder
    159 -- 169Jean Arlat, William C. Carter. Implementation and Evaluation of a (::::b, k::::)-Adjacent Error-Correcting/Detecting Scheme for Supercomputer Systems
    170 -- 176Douglas C. Bossen, Chin-Long Chen, M. Y. (Ben) Hsiao. Fault Alignment Exclusion for Memory Using Address Permutation
    177 -- 183F. J. Aichelmann Jr.. Fault-Tolerant Design Techniques for Semiconductor Memory Applications
    184 -- 195C. L. Chen, Robert A. Rutledge. Fault-Tolerant Memory Simulator
    196 -- 205Marvin R. Libson, Harold E. Harvey. A General-Purpose Memory Reliability Simulator
    206 -- 211Thomas D. Howell. Analysis of Correctable Errors in the IBM 3380 Disk File
    212 -- 219Donald T. Tang, C. L. Chen. Iterative Exhaustive Pattern Generation for Logic Testing
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