| 602 | -- | 602 | H. Kumar Wickramasinghe, Daniel Rugar. Preface |
| 603 | -- | 616 | Phaedon Avouris, In-Whan Lyo, Yukio Hasegawa. Probing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS |
| 617 | -- | 628 | C. Mathew Mate. Force microscopy studies of the molecular origins of friction and lubrication |
| 629 | -- | 638 | Martin A. Lutz, Randall M. Feenstra, Jack O. Chu. Atomic force microscopy studies of SiGe films and Si/SiGe heterostructures |
| 639 | -- | 654 | David D. Chambliss, Robert J. Wilson, Shirley Chiang. The use of STM to study metal film epitaxy |
| 655 | -- | 668 | John R. Kirtley, Mark B. Ketchen, Chang C. Tsuei, Jonathan Z. Sun, William J. Gallagher, Lock See Yu-Jahnes, Arunava Gupta, Kevin G. Stawiasz, Shalom J. Wind. Design and applications of a scanning SQUID microscope |
| 669 | -- | 680 | Gary M. McClelland, Harry Heinzelmann, Fumiya Watanabe. The femtosecond field-emission camera, a device for continuous observation of the motion of individual adsorbed atoms and molecules |
| 681 | -- | 700 | H. Jonathon Mamin, Bruce D. Terris, Long-Sheng Fan, Storrs Hoen, Robert C. Barrett, Daniel Rugar. High-density data storage using proximal probe techniques |
| 701 | -- | 712 | Dieter W. Pohl. Some thoughts about scanning probe microscopy, micromechanics, and storage |