Journal: IEICE Transactions

Volume 91-C, Issue 8

1177 -- 0Shigeru Umemura. Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007)
1178 -- 1191Roland S. Timsit. High Speed Electronic Connector Design: A Review of Electrical and Electromagnetic Properties of Passive Contact Elements - Part 1
1192 -- 1198Terutaka Tamai, Yasushi Saitoh, Yasuhiro Hattori, Hirosaka Ikeda. Contact Resistance Characteristics of Improved Conductive Elastomer Contacts for Contaminated Printed Circuit Board in SO::2:: Environment
1199 -- 1205Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida. Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness
1206 -- 1210Noboru Wakatsuki, Hiroshi Honma. Breaking Contact Phenomena of a Time-coordinated Non-arcing Relay
1211 -- 1214Yoshitada Watanabe, Yuichi Hirakawa. A Study on Contact Spots of Earthquake Disaster Prevention Relays
1215 -- 1221Guofu Zhai, Wenying Yang, Xue Zhou. 3-D Finite Element Analysis of Dynamic Characteristics of Twin-Type Relay Interfered by Uniform Constant Magnetic Field
1222 -- 1227Yi Wu, Mingzhe Rong, Jian Li, Xiaohua Wang. Research on Effect of Ferromagnetic Material on the Critical Current of Bi-2223 Tape
1228 -- 1229Xingwen Li, Degui Chen. An Integrated Calculation Method to Predict Arc Behavior
1230 -- 1232Yoshiki Kayano, Hikaru Miura, Kazuaki Miyanaga, Hiroshi Inoue. The Relationship between Voltage and Duration of Short-Time Arc Generated by Slowly Breaking Silver Contact
1233 -- 1239Guofu Zhai, Xue Zhou. Study on Arc Generated by Opening Electromagnetic Relay Contacts in DC Low-Current Resistive Circuit with Constant Velocity
1240 -- 1248Qiang Ma, Mingzhe Rong, Anthony B. Murphy, Yi Wu, Tiejun Xu, Fei Yang. Simulation and Experimental Study of Arc Motion in a Low-Voltage Circuit Breaker Considering Wall Ablation
1249 -- 1254Junya Sekikawa, Takumi Sugio, Takayoshi Kubono. Relationship between Arc Duration and Motion of Arc Spots for Break Arcs of Ag and Ag/ZnO Electrical Contacts
1255 -- 1260Junya Sekikawa, Takayoshi Kubono. Motion of Break Arcs Driven by External Magnetic Field in a DC42 V Resistive Circuit
1261 -- 1267Ruicheng Dai, Degui Chen, Xingwen Li, Chunping Niu, Weixiong Tong, Honggang Xiang. Effect of Back-Volume of Arc-Quenching Chamber on Arc Behavior
1268 -- 1272Junya Sekikawa, Naoki Moriyama, Takayoshi Kubono. Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit
1273 -- 1279Yingyi Liu, Degui Chen, Chunping Niu, Liang Ji, Weixiong Tong. Analysis and Optimization for a Contactor with Feedback Controlled Magnet System
1280 -- 1285Degui Chen, Liang Ji, Yunfeng Wang, Yingyi Liu. Analysis and Optimization for the Operating Mechanism of Air Circuit Breaker
1286 -- 1291Chunping Niu, Degui Chen, Xingwen Li, Yingsan Geng. Thermal Analysis of AC Contactor Using Thermal Network Finite Difference Analysis Method
1292 -- 1298Honggang Xiang, Degui Chen, Xingwen Li, Weixiong Tong. A New Method to Evaluate the Short-Time Withstand Current for Air Circuit Breaker
1299 -- 1305Xiaohua Wang, Mingzhe Rong, Juan Qiu, Dingxin Liu, Biao Su, Yi Wu. Research on Mechanical Fault Prediction Algorithm for Circuit Breaker Based on Sliding Time Window and ANN
1306 -- 1312Yu-ichi Hayashi, Hideaki Sone. Fundamental Measurement of Electromagnetic Field Radiated from a Coaxial Transmission Line Caused by Connector Contact Failure
1313 -- 1314Yoshio Mita. Special Section on Microelectronic Test Structures (ICMTS2007)
1315 -- 1320Weidong Tian, Joe R. Trogolo, Bob Todd. Leakage Current and Floating Gate Capacitor Matching Test
1321 -- 1330Chun-Yu Lin, Ming-Dou Ker, Guo-Xuan Meng. Low-Capacitance and Fast Turn-on SCR for RF ESD Protection
1331 -- 1337Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku. A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs
1338 -- 1347Masako Fujii, Koji Nii, Hiroshi Makino, Shigeki Ohbayashi, Motoshige Igarashi, Takeshi Kawamura, Miho Yokota, Nobuhiro Tsuda, Tomoaki Yoshizawa, Toshikazu Tsutsui, Naohiko Takeshita, Naofumi Murata, Tomohiro Tanaka, Takanari Fujiwara, Kyoko Asahina, Masakazu Okada, Kazuo Tomita, Masahiko Takeuchi, Shigehisa Yamamoto, Hiromitsu Sugimoto, Hirofumi Shinohara. A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology
1348 -- 1355Hirokazu Oba, Minseok Kim, Ryotaro Tamaki, Hiroyuki Arai. Adaptive Impedance Matching System Using FPGA Processor for Efficient Control Algorithm
1356 -- 1364Hsuan-I Pan, Chern-Lin Chen. A CMOS Low Dropout Regulator with Extended Stable Region for the Effective Series Resistance of the Output Capacitor
1365 -- 1370Feng Liang, ShaoChong Lei, ZhiBiao Shao. A Single Input Change Test Pattern Generator for Sequential Circuits
1371 -- 1374Sheng-Lyang Jang, Chia-Wei Chang, Sheng-Chien Wu, Chien-Feng Lee, Lin-yen Tsai, Jhin-Fang Huang. Quadrature Hartley VCO and Injection-Locked Frequency Divider
1375 -- 1378Jun Wang, Tuck-Yang Lee, Dong-Gyou Kim, Toshimasa Matsuoka, Kenji Taniguchi. Design of a 0.5 V Op-Amp Based on CMOS Inverter Using Floating Voltage Sources
1379 -- 1381Norio Sadachika, Takahiro Murakami, Hideki Oka, Ryou Tanabe, Hans Jürgen Mattausch, Mitiko Miura-Mattausch. Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization