1177 | -- | 0 | Shigeru Umemura. Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007) |
1178 | -- | 1191 | Roland S. Timsit. High Speed Electronic Connector Design: A Review of Electrical and Electromagnetic Properties of Passive Contact Elements - Part 1 |
1192 | -- | 1198 | Terutaka Tamai, Yasushi Saitoh, Yasuhiro Hattori, Hirosaka Ikeda. Contact Resistance Characteristics of Improved Conductive Elastomer Contacts for Contaminated Printed Circuit Board in SO::2:: Environment |
1199 | -- | 1205 | Tetsuya Ito, Shigeru Sawada, Yasuhiro Hattori, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida. Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness |
1206 | -- | 1210 | Noboru Wakatsuki, Hiroshi Honma. Breaking Contact Phenomena of a Time-coordinated Non-arcing Relay |
1211 | -- | 1214 | Yoshitada Watanabe, Yuichi Hirakawa. A Study on Contact Spots of Earthquake Disaster Prevention Relays |
1215 | -- | 1221 | Guofu Zhai, Wenying Yang, Xue Zhou. 3-D Finite Element Analysis of Dynamic Characteristics of Twin-Type Relay Interfered by Uniform Constant Magnetic Field |
1222 | -- | 1227 | Yi Wu, Mingzhe Rong, Jian Li, Xiaohua Wang. Research on Effect of Ferromagnetic Material on the Critical Current of Bi-2223 Tape |
1228 | -- | 1229 | Xingwen Li, Degui Chen. An Integrated Calculation Method to Predict Arc Behavior |
1230 | -- | 1232 | Yoshiki Kayano, Hikaru Miura, Kazuaki Miyanaga, Hiroshi Inoue. The Relationship between Voltage and Duration of Short-Time Arc Generated by Slowly Breaking Silver Contact |
1233 | -- | 1239 | Guofu Zhai, Xue Zhou. Study on Arc Generated by Opening Electromagnetic Relay Contacts in DC Low-Current Resistive Circuit with Constant Velocity |
1240 | -- | 1248 | Qiang Ma, Mingzhe Rong, Anthony B. Murphy, Yi Wu, Tiejun Xu, Fei Yang. Simulation and Experimental Study of Arc Motion in a Low-Voltage Circuit Breaker Considering Wall Ablation |
1249 | -- | 1254 | Junya Sekikawa, Takumi Sugio, Takayoshi Kubono. Relationship between Arc Duration and Motion of Arc Spots for Break Arcs of Ag and Ag/ZnO Electrical Contacts |
1255 | -- | 1260 | Junya Sekikawa, Takayoshi Kubono. Motion of Break Arcs Driven by External Magnetic Field in a DC42 V Resistive Circuit |
1261 | -- | 1267 | Ruicheng Dai, Degui Chen, Xingwen Li, Chunping Niu, Weixiong Tong, Honggang Xiang. Effect of Back-Volume of Arc-Quenching Chamber on Arc Behavior |
1268 | -- | 1272 | Junya Sekikawa, Naoki Moriyama, Takayoshi Kubono. Time-Resolved Spectroscopic Temperature Measurement of Break Arcs in a D.C.42 V Resistive Circuit |
1273 | -- | 1279 | Yingyi Liu, Degui Chen, Chunping Niu, Liang Ji, Weixiong Tong. Analysis and Optimization for a Contactor with Feedback Controlled Magnet System |
1280 | -- | 1285 | Degui Chen, Liang Ji, Yunfeng Wang, Yingyi Liu. Analysis and Optimization for the Operating Mechanism of Air Circuit Breaker |
1286 | -- | 1291 | Chunping Niu, Degui Chen, Xingwen Li, Yingsan Geng. Thermal Analysis of AC Contactor Using Thermal Network Finite Difference Analysis Method |
1292 | -- | 1298 | Honggang Xiang, Degui Chen, Xingwen Li, Weixiong Tong. A New Method to Evaluate the Short-Time Withstand Current for Air Circuit Breaker |
1299 | -- | 1305 | Xiaohua Wang, Mingzhe Rong, Juan Qiu, Dingxin Liu, Biao Su, Yi Wu. Research on Mechanical Fault Prediction Algorithm for Circuit Breaker Based on Sliding Time Window and ANN |
1306 | -- | 1312 | Yu-ichi Hayashi, Hideaki Sone. Fundamental Measurement of Electromagnetic Field Radiated from a Coaxial Transmission Line Caused by Connector Contact Failure |
1313 | -- | 1314 | Yoshio Mita. Special Section on Microelectronic Test Structures (ICMTS2007) |
1315 | -- | 1320 | Weidong Tian, Joe R. Trogolo, Bob Todd. Leakage Current and Floating Gate Capacitor Matching Test |
1321 | -- | 1330 | Chun-Yu Lin, Ming-Dou Ker, Guo-Xuan Meng. Low-Capacitance and Fast Turn-on SCR for RF ESD Protection |
1331 | -- | 1337 | Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku. A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs |
1338 | -- | 1347 | Masako Fujii, Koji Nii, Hiroshi Makino, Shigeki Ohbayashi, Motoshige Igarashi, Takeshi Kawamura, Miho Yokota, Nobuhiro Tsuda, Tomoaki Yoshizawa, Toshikazu Tsutsui, Naohiko Takeshita, Naofumi Murata, Tomohiro Tanaka, Takanari Fujiwara, Kyoko Asahina, Masakazu Okada, Kazuo Tomita, Masahiko Takeuchi, Shigehisa Yamamoto, Hiromitsu Sugimoto, Hirofumi Shinohara. A Large-Scale, Flip-Flop RAM Imitating a Logic LSI for Fast Development of Process Technology |
1348 | -- | 1355 | Hirokazu Oba, Minseok Kim, Ryotaro Tamaki, Hiroyuki Arai. Adaptive Impedance Matching System Using FPGA Processor for Efficient Control Algorithm |
1356 | -- | 1364 | Hsuan-I Pan, Chern-Lin Chen. A CMOS Low Dropout Regulator with Extended Stable Region for the Effective Series Resistance of the Output Capacitor |
1365 | -- | 1370 | Feng Liang, ShaoChong Lei, ZhiBiao Shao. A Single Input Change Test Pattern Generator for Sequential Circuits |
1371 | -- | 1374 | Sheng-Lyang Jang, Chia-Wei Chang, Sheng-Chien Wu, Chien-Feng Lee, Lin-yen Tsai, Jhin-Fang Huang. Quadrature Hartley VCO and Injection-Locked Frequency Divider |
1375 | -- | 1378 | Jun Wang, Tuck-Yang Lee, Dong-Gyou Kim, Toshimasa Matsuoka, Kenji Taniguchi. Design of a 0.5 V Op-Amp Based on CMOS Inverter Using Floating Voltage Sources |
1379 | -- | 1381 | Norio Sadachika, Takahiro Murakami, Hideki Oka, Ryou Tanabe, Hans Jürgen Mattausch, Mitiko Miura-Mattausch. Compact Double-Gate Metal-Oxide-Semiconductor Field Effect Transistor Model for Device/Circuit Optimization |