Journal: Proceedings of the IEEE

Volume 74, Issue 3

387 -- 388Laurence R. Lines. Scanning the issue
389 -- 400Bjørn Ursin, Karl-A. Berteussen. Comparison of some inverse methods for wave propagation in layered media
401 -- 414Jerry M. Mendel, John Goutsias. One-dimensional normal-incidence inversion: A solution procedure for band-limited and noisy data
415 -- 427A. J. Berkhout. Seismic inversion in terms of pre-stack migration and multiple elimination
428 -- 439Endres A. Robinson. Migration of seismic data by the WKBJ method
440 -- 456Samuel H. Gray, Norman Bleistein. Imaging and inversion of zero-offset seismic data
457 -- 465Robert Sun, George A. McMechan. Pre-stack reverse-time migration for elastic waves with application to synthetic offset vertical seismic profiles
466 -- 475Cengiz Esmersoy, Bernard C. Levy. Multidimensional born inversion with a wide-band plane-wave source
476 -- 486Robert G. Keys. An application of Marquardt's procedure to the seismic inverse problem
487 -- 497Douglas W. Oldenburg, Shlomo Levy, Kerry J. Stinson. Inversion of band-limited reflection seismograms: Theory and practice
498 -- 508Pierre Kolb, Francis Collino, Patrick Lailly. Pre-stack inversion of a 1-D medium
513 -- 514Muhammet Köksal. On the state equations of nonlinear networks and the uniqueness of their solutions
515 -- 516Jim C. Harden. Comments on "Sources of failures and yield improvement for VLSI and restructurable interconnects for RVLSI and WSI: Part I - Sources of failures and yield improvement for VLSI"
516 -- 518Vasil Uzunoglu, Marvin H. White. Some important properties of synchronous oscillators
518 -- 519Harold H. Szu, Richard A. Messner. Adaptive invariant novelty filters
520 -- 521J. L. Brown Jr.. A Hilbert transform product theorem
522 -- 523Richard Barakat. Covariance and power spectrum of a sinusoidal carrier, angel modulated by a uniformly distributed random process
523 -- 524Giuseppe Martinelli, Gianni Orlandi, Pietro Burrascano. Spectral estimation by repetitive L1-norm minimization
525 -- 526Alexander Micho. Developments in expert systems
525 -- 0Thomas W. Williams. Design of testable logic circuits