| 453 | -- | 471 | Jie Zhang, Albert Lin, Nishant Patil, Hai Wei, Lan Wei, H.-S. Philip Wong, Subhasish Mitra. Carbon Nanotube Robust Digital VLSI |
| 472 | -- | 484 | Khaled R. Heloue, Sari Onaissi, Farid N. Najm. Efficient Block-Based Parameterized Timing Analysis Covering All Potentially Critical Paths |
| 485 | -- | 496 | Jaeyong Chung, Jacob A. Abraham. Refactoring of Timing Graphs and Its Use in Capturing Topological Correlation in SSTA |
| 497 | -- | 508 | Jaeyong Chung, Jinjun Xiong, Vladimir Zolotov, Jacob A. Abraham. Path Criticality Computation in Parameterized Statistical Timing Analysis Using a Novel Operator |
| 509 | -- | 521 | Walid Ibrahim, Valeriu Beiu, Azam Beg. GREDA: A Fast and More Accurate Gate Reliability EDA Tool |
| 522 | -- | 531 | Tom J. Kazmierski, Leran Wang, Bashir M. Al-Hashimi, Geoff V. Merrett. An Explicit Linearized State-Space Technique for Accelerated Simulation of Electromagnetic Vibration Energy Harvesters |
| 532 | -- | 545 | Yuanzhe Wang, Zheng Zhang, Cheng-Kok Koh, Guoyong Shi, Grantham K. H. Pang, Ngai Wong. Passivity Enforcement for Descriptor Systems Via Matrix Pencil Perturbation |
| 546 | -- | 558 | Hyungmin Cho, Larkhoon Leem, Subhasish Mitra. ERSA: Error Resilient System Architecture for Probabilistic Applications |
| 559 | -- | 572 | Hyunsun Park, Sungjoo Yoo, Sunggu Lee. A Multistep Tag Comparison Method for a Low-Power L2 Cache |
| 573 | -- | 585 | Giorgos Passas, Manolis Katevenis, Dionisios N. Pnevmatikatos. Crossbar NoCs Are Scalable Beyond 100 Nodes |
| 586 | -- | 596 | Sonali Chouhan, M. Balakrishnan, Ranjan Bose. System-Level Design Space Exploration Methodology for Energy-Efficient Sensor Node Configurations: An Experimental Validation |
| 597 | -- | 609 | Hao-Chiao Hong. A Static Linear Behavior Analog Fault Model for Switched-Capacitor Circuits |
| 610 | -- | 619 | Dongsoo Lee, Kaushik Roy. Viterbi-Based Efficient Test Data Compression |
| 620 | -- | 629 | Shyue-Kung Lu, Zhen-Yu Wang, Yi-Ming Tsai, Jiann-Liang Chen. Efficient Built-In Self-Repair Techniques for Multiple Repairable Embedded RAMs |
| 630 | -- | 643 | Hongxia Fang, Krishnendu Chakrabarty, Zhiyuan Wang, Xinli Gu. Reproduction and Detection of Board-Level Functional Failure |
| 644 | -- | 648 | Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Cheng-Ho Chang. $2^{n}$ Pattern Run-Length for Test Data Compression |