Journal: IEEE Trans. on CAD of Integrated Circuits and Systems

Volume 34, Issue 9

1373 -- 1386Po-Cheng Pan, Ching-Yu Chin, Hung-Ming Chen, Tung-Chieh Chen, Chin-Chieh Lee, Jou-Chun Lin. A Fast Prototyping Framework for Analog Layout Migration With Planar Preservation
1387 -- 1400Yun Liang, Tulika Mitra, Lei Ju. Instruction Cache Locking Using Temporal Reuse Profile
1401 -- 1414Xuan Wang, Jiang Xu, Zhe Wang, Kevin J. Chen, Xiaowen Wu, Zhehui Wang, Peng Yang, Luan H. K. Duong. An Analytical Study of Power Delivery Systems for Many-Core Processors Using On-Chip and Off-Chip Voltage Regulators
1415 -- 1428Santiago Pagani, Jian-Jia Chen, Jörg Henkel. Energy and Peak Power Efficiency Analysis for the Single Voltage Approximation (SVA) Scheme
1429 -- 1440Chia-Hung Liu, Ting Wei Chiang, Juinn-Dar Huang. Reactant Minimization in Sample Preparation on Digital Microfluidic Biochips
1441 -- 1454Zoha Pajouhi, Swagath Venkataramani, Karthik Yogendra, Anand Raghunathan, Kaushik Roy. Exploring Spin-Transfer-Torque Devices for Logic Applications
1455 -- 1466Jaeil Lim, Hyunyul Lim, Sungho Kang. 3-D Stacked DRAM Refresh Management With Guaranteed Data Reliability
1467 -- 1480Honghuang Lin, Peng Li. Circuit Performance Classification With Active Learning Guided Sampling for Support Vector Machines
1481 -- 1494Xiao Li, Fan Yang, DaKe Wu, Zhenya Zhou, Xuan Zeng. MOS Table Models for Fast and Accurate Simulation of Analog and Mixed-Signal Circuits Using Efficient Oscillation-Diminishing Interpolations
1495 -- 1508Suleyman Tosun, Vahid Babaei Ajabshir, Ozge Mercanoglu, Özcan Özturk. Fault-Tolerant Topology Generation Method for Application-Specific Network-on-Chips
1509 -- 1522Sandeep Chatterjee, Mohammad Fawaz, Farid N. Najm. Redundancy-Aware Power Grid Electromigration Checking Under Workload Uncertainties
1523 -- 1536Mukesh Agrawal, Krishnendu Chakrabarty. Test-Cost Modeling and Optimal Test-Flow Selection of 3-D-Stacked ICs